Depth-detection methods for CNT manipulation and characterization in a scanning electron microscope
von Sergej Fatikow ; Volkmar Eichhorn ; Thomas Wich ; Torsten Sievers ; Olaf C. Hänßler ; Karin N. Andersen
2007
Details anzeigenInternational Conference on Mechatronics and Automation, 2007, ICMA 2007, 5- 8 Aug. 2007, Harbin, China Piscataway, 2007
Englisch